Prior art

Analysis of Prior Art for U.S. Patent 9,507,477

Washington D.C. – April 26, 2026 – An analysis of the prior art cited against U.S. Patent No. 9,507,477, titled "Display device," reveals a landscape of existing technologies that address the challenge of detecting defects in the signal interconnections of display panels, particularly those integrated with touch screens. The patent, assigned to Paneltouch Technologies LLC as of the latest records, details a method for easily inspecting for breaks in these connections, which can occur from chipping or cracking of the substrate. This is achieved by incorporating a dedicated "second signal interconnect" or "detection interconnect" along the periphery of the device's transparent substrate.

The core of the invention, as outlined in the independent claims, is a display device that includes a coordinate input device (like a touch panel) with a special conductive line placed near the edge of the substrate. This line is not for primary display or touch functions but serves as a test circuit. A break in this line, which can be checked electrically, indicates physical damage to the substrate that could also have severed the more critical signal lines.

An examination of the prior art cited by the patent examiner during the prosecution of patent 9,507,477 highlights several key earlier inventions. While none of these were deemed to fully anticipate the claims of the '477 patent, they provide a technical backdrop and, in some cases, disclose elements that overlap with the patent's claims.

Key Prior Art and Potential Anticipation:

The following patents are the most relevant prior art references cited against US 9,507,477. The analysis considers their potential to anticipate the patent's claims under 35 U.S.C. § 102, which pertains to novelty.

1. U.S. Patent No. 8,704,762 (Anno et al.)

• Full Citation: US Patent 8,704,762 B2
• Publication Date: April 22, 2014
• Filing Date: April 22, 2011
• Brief Description: This patent, which is from the same inventors and is part of the same patent family as the '477 patent, also describes a display device with a touch panel that includes a detection interconnect for identifying substrate damage. It essentially discloses the foundational concepts that are further refined in the '477 patent.
• Potential Anticipation: As a related application, it does not anticipate in the traditional sense but rather shows the evolution of the inventive concept. However, its disclosure is highly relevant. Specifically, it describes a "second signal interconnect" for detecting chipping, which is a core element of claim 1 of the '477 patent. The key distinction and inventive step claimed in the '477 patent appear to be in the specifics of the arrangement and integration of this detection line.

2. Japanese Patent Application Publication No. 2002-350896 A

• Full Citation: JP 2002-350896 A
• Publication Date: December 6, 2002
• Brief Description: This reference discloses a liquid crystal display device where common interconnects are connected at the peripheral edge of the display. The purpose is to enable the detection of disconnection in these common interconnects. This is achieved by creating a loop that can be tested for continuity.
• Potential Anticipation: This Japanese patent application is significant as it teaches the general principle of using peripheral interconnects for defect detection. It could be argued that this reference anticipates the broader concept within claim 1 of using a dedicated interconnect for detecting breaks. However, the '477 patent claims a "second signal interconnect" that is distinct from the primary "first signal interconnects" used for the touch electrodes, a nuance that may not be explicitly present in the Japanese reference.

3. Japanese Patent Application Publication No. 1997-80478 A

• Full Citation: JP H09-80478 A
• Publication Date: March 28, 1997
• Brief Description: This document describes a technique for detecting short-circuits in the drain lines of a liquid crystal display by using a provisional interconnect that is formed in parallel with the gate lines.
• Potential Anticipation: While focused on short-circuit detection rather than open-circuit detection from physical damage, this reference does disclose the use of an additional, non-functional interconnect for testing purposes. It could be considered to teach the element of an auxiliary interconnect for inspection, which is a feature of the claims in the '477 patent. The distinction lies in the type of fault detected and the specific placement and purpose of the interconnect.

4. Japanese Patent Application Publication No. 1995-152043 A

• Full Citation: JP H07-152043 A
• Publication Date: June 16, 1995
• Brief Description: This publication addresses the manufacturing of multiple liquid crystal display devices from a single glass substrate. It proposes providing common interconnects in the regions where the individual devices are separated to facilitate testing before the substrate is cut.
• Potential Anticipation: This reference is relevant to the manufacturing context of the '477 patent. It teaches the use of temporary, shared interconnects for testing during the fabrication process. While these interconnects are ultimately severed, the concept of adding conductive lines for the purpose of inspection is present. This could be argued to anticipate the general idea of an inspection interconnect, though the '477 patent's claims are directed to a permanent feature of the final, individual display device.

In conclusion, while the cited prior art establishes a foundation for using auxiliary electrical lines to test the integrity of display panels, the specific implementation claimed in U.S. Patent 9,507,477, namely a dedicated, peripheral "second signal interconnect" for detecting physical damage in a display device with an integrated touch panel, was deemed novel and non-obvious by the patent examiner. The key to the patent's validity lies in the detailed arrangement and the specific problem it solves – a simplified method for post-manufacturing inspection of substrate integrity.