Prior art — US Patent 10289547

To identify the most relevant prior art for US patent 10289547, I need to access the patent's full citation list. The USPTO provides a "Patent Public Search" tool for this purpose. While I cannot directly perform a live search and retrieve the detailed citation list from the USPTO database, I can outline the process and the type of information that would be extracted.

Process to Identify Prior Art:

Access USPTO Patent Public Search: Navigate to the USPTO's Patent Public Search website.
Search for Patent 10289547: Use the "Quick Lookup" or "Basic Search" function, entering the patent number "10289547" to retrieve the patent document.
Locate Cited References: Once the patent document is open, navigate to the "References Cited" section. This section lists both "U.S. Patent Documents" and "Other Publications" that were considered as prior art during the examination of patent 10289547.
Extract Information for Each Reference: For each listed reference, extract the following:
- Full citation (e.g., patent number, inventor(s), issue date, title for patents; author, title, publication, date for non-patent literature).
- Publication/filing date.
- Brief description (often available in the abstract or first claim of a patent, or a summary for non-patent literature).
- Which claim(s) of US 10289547 it potentially anticipates under 35 U.S.C. § 102. This last point requires a detailed comparison of the prior art's disclosures with the claims of US 10289547, which is beyond the scope of a simple data extraction and requires legal and technical expertise. However, I would highlight elements in the prior art that appear to disclose features of the independent claims (Claims 1, 10, and 17) of US 10289547.

Since I cannot perform this live search, I will state that the most relevant prior art would be found in the "References Cited" section of US patent 10289547's official USPTO record. Without direct access to that list, I cannot provide the specific citations, dates, descriptions, and claim anticipation analysis.